CLOCK AND DATA RECOVERY METHOD

摘要

A clock and data recovery method is provided to solve a power consumption problem when applying a CDR test to all pins by applying a CDR test to only a specific pin. A clock and data recovery method is comprised of steps: determining one of data pins at the semiconductor memory device as a specific pin(220); testing a CDR test to the specific pin(230); removing a skew of the other pine excepting the specific pin by using phase difference which is determined at the CDR test(240).