发明名称 Transistors, semiconductor integrated circuit interconnections and methods of forming the same
摘要 Provided are transistors, semiconductor integrated circuit interconnections and methods of forming the same. The transistors, semiconductor integrated circuit interconnections and methods of forming the same may improve electrical characteristics between gate electrodes or interconnection electrodes and simplify a semiconductor fabrication process related to gate electrodes or interconnection electrodes. A material layer having first and second regions may be prepared. A trench may be formed in a selected portion of the first region. Transistors or semiconductor integrated circuit interconnections may be in the first and second regions, respectively. One of the transistors or the semiconductor integrated circuit interconnections may be formed in the trench. The transistors or the semiconductor integrated circuit interconnections may be electrically insulated from each other.
申请公布号 US7439581(B2) 申请公布日期 2008.10.21
申请号 US20070704364 申请日期 2007.02.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM SEONG-GOO;LEE KANG-YOON;KIM YUN-GI;KIM BONG-SOO
分类号 H01L29/76 主分类号 H01L29/76
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