发明名称 |
Integrated semiconductor memory with determination of a chip temperature |
摘要 |
An integrated semiconductor memory capable of determining a chip temperature includes first control terminals for driving the integrated semiconductor memory with first control signals for performing a write access and second control terminals provided for performing a read access. The integrated semiconductor further includes a control circuit for controlling a write and read access. A temperature sensor for recording a chip temperature of the integrated semiconductor memory is connected to the control circuit. The control circuit is configured to generate a state of a third control signal at one of the first or at one of the second control terminals in a manner dependent on a temperature recorded by the temperature sensor.
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申请公布号 |
US7440349(B2) |
申请公布日期 |
2008.10.21 |
申请号 |
US20060635088 |
申请日期 |
2006.12.07 |
申请人 |
QIMONDA AG |
发明人 |
BRAUN GEORG;NYGREN AARON |
分类号 |
G11C7/04;G11C5/00;G11C7/00;G11C17/18 |
主分类号 |
G11C7/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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