发明名称 Method of making and structure of multilayer laue lens for focusing hard x-rays
摘要 A zone plate multilayer structure includes a substrate carrying a plurality of alternating layers respectively formed of tungsten silicide (WSi<SUB>2</SUB>) and silicon (Si). The alternating layers are sequentially deposited precisely controlling a thickness of each layer from a minimum thickness of a first deposited layer adjacent the substrate to a maximum thickness of a last deposited layer. The first minimum thickness layer has a selected thickness of less than or equal to 5 nm with the thickness of the alternating layers monotonically increasing to provide a zone plate multilayer structure having a thickness of greater than 12 mum (microns). The x-rays are diffracted in Laue transmission geometry by the specific arrangement of silicon and tungsten silicide.
申请公布号 US7440546(B2) 申请公布日期 2008.10.21
申请号 US20060634681 申请日期 2006.12.06
申请人 UCHICAGO ARGONNE, LLC 发明人 LIU CHIAN Q.;CONLEY RAYMOND P.;MACRANDER ALBERT T.;KANG HYON CHOL;STEPHENSON G. BRIAN;MASER JORG
分类号 G21K1/06 主分类号 G21K1/06
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