| 摘要 |
A method of fabricating a semiconductor device having a capacitor is provided. The method includes forming second, third, fourth, and fifth insulating layers on a first conductive layer formed in a first insulating layer. The fourth insulating layer is patterned into a first pattern before forming the fifth insulating layer thereupon. A capacitor and contact plug are formed by etching the fifth insulating layer to expose the first pattern; etching the third insulating layer using the exposed first pattern as a mask to expose the second insulating layer; exposing the first conductive layer at a capacitor region and contact plug region by etching the exposed second insulating layer; forming a second conductive layer on the exposed first conductive layer and sidewalls of the insulating layers; forming a dielectric on the second conductive layer in the capacitor region; and filling the capacitor and contact plug regions with a third conductive layer.
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