发明名称 Tungsten plug drain extension
摘要 A power metal-oxide-semiconductor field effect transistor (MOSFET) cell includes a semiconductor substrate. A first electrode is disposed on the semiconductor substrate. A voltage sustaining layer is formed on the semiconductor substrate. A highly doped active zone of a first conductivity type is formed in the voltage sustaining layer opposite the semiconductor substrate. The highly doped active zone has a central aperture and a channel region that is generally centrally located within the central aperture. A terminal region of the second conductivity type is disposed in the voltage sustaining layer proximate the highly doped active zone. The terminal region has a central aperture with an opening dimension generally greater than an opening dimension of the central aperture of the highly doped zone. An extension region is disposed in the voltage sustaining region within the central aperture of the highly doped active zone.
申请公布号 US7439583(B2) 申请公布日期 2008.10.21
申请号 US20050318988 申请日期 2005.12.27
申请人 THIRD DIMENSION (3D) SEMICONDUCTOR, INC. 发明人 HSHIEH FWU-IUAN
分类号 H01L29/78 主分类号 H01L29/78
代理机构 代理人
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