| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit, capable of reducing the power consumption of a circuit laid in a standby state by shortening saving-restoration time of internal state. <P>SOLUTION: The semiconductor integrated circuit comprises an object circuit and a backup control circuit. The object circuit includes at least one scan chain which forms a shift register in a scan path test and serially inputting and outputting test data. The backup control circuit stores internal state data showing the internal state of the object circuit in a memory, and reads the internal state data from the memory. The scan chain is divided to a plurality of sub-scan chains. The plurality of sub-scan chains operate in parallel. The internal state data is output from the plurality of sub-scan chains and stored in the memory. The internal state data stored in the memory is reset to the plurality of sub-scan chains, and the object circuit returns to the original internal state and restarts operation. <P>COPYRIGHT: (C)2009,JPO&INPIT |
