发明名称 PLASMA PROCESSOR
摘要 PROBLEM TO BE SOLVED: To provide a plasma processor which reduces a foreign mater and contaminant generated from an inner wall of a processing chamber and controls a plasma distribution. SOLUTION: In the plasma processor, a sample placed on a sample tray 109 disposed inside a processing chamber 100 is processed by use of a plasma produced in the processing chamber 100. A quartz cover 141 containing a conductive material 401 is installed inside an inner wall member 116. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008251857(A) 申请公布日期 2008.10.16
申请号 JP20070091722 申请日期 2007.03.30
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KAWAGUCHI TADAYOSHI;FURUSE MUNEO
分类号 H01L21/3065;H01L21/304 主分类号 H01L21/3065
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