发明名称 CHARGED PARTICLE SPIN POLARIMETER, MICROSCOPE, AND PHOTOELECTRON SPECTROSCOPY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charged particle spin polarimeter capable of resolving the magnetic moment of charged particles with high efficiency. SOLUTION: The charged particle spin polarimeter has a pair of convex and concave magnetic poles for applying a magnetic field with gradient to an incident charged particle and a pair of flat plate electrodes to apply an electric field to a charged particle to cancel the Lorentz force that the charged particle receives from the magnetic field. The magnetic moment of a charged particle in the direction of the magnetic field is resolved by the interaction between the gradient of the magnetic field and the magnetic moment of the charged particle. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008251525(A) 申请公布日期 2008.10.16
申请号 JP20080002093 申请日期 2008.01.09
申请人 HITACHI LTD 发明人 TAKAHASHI TERUO
分类号 H01J37/244;H01J37/28 主分类号 H01J37/244
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