发明名称 Positive resist composition and patterning process
摘要 A positive resist composition comprises (A) a resin component which becomes soluble in an alkaline developer under the action of an acid, and (B) an acid generator which is a specific sulfonium salt compound. The resin (A) is a polymer comprising tertiary alkyl protective group units having a hydrophobic tetracyclo[4.4.0.1<SUP>2,5</SUP>.1<SUP>7,10</SUP>]dodecane structure, di- or trihydroxyadamantyl units, and monocyclic lactone units.
申请公布号 US2008254386(A1) 申请公布日期 2008.10.16
申请号 US20080003834 申请日期 2008.01.02
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 NISHI TSUNEHIRO;TACHIBANA SEIICHIRO;KOBAYASHI KATSUHIRO
分类号 G03F7/004;G03F7/20 主分类号 G03F7/004
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