| 摘要 |
<p>A conventional surface inspection device has been required to make an inspection field small in the case where a painted surface is curved and it takes a long time to inspect the surface in the case where the painted surface is large in area. Further, the surface inspection device has been required to impose a heavy load on an image processing unit, so that its processing time is inclined to be long. In order to solve such problems, an surface inspection device (1) is provided with a light irradiating unit (12) that irradiates diffused light to a pained surface (90), wherein the diffused light has light and dark patterns and boundary portions between light and dark portions in the light and dark patterns have gradation in luminosity: a camera (11) that picks up an image reflecting from the pained surface (90); and an image processing device (50) that processes the image (80) picked-up by the image picking-up unit to detect an irregularity (91), wherein the image processing device (50) is comprised of a differential processing unit (52) for processing a differential and a binarizing unit (53) for binarizing the picked-up image (80) after the differential.</p> |
