发明名称 WORD-LINE TEST CONTROL CIRCUIT
摘要 A word-line test control circuit is provided to test read and write operation, by performing a precharge command after an active command during multi word line test. A burn-in test control unit(110) outputs a test enable signal by performing logic operation of a burn-in test signal. A precharging control unit(400) outputs a row decoder control signal by performing logic operation of the test enable signal, a bank active signal and a multi word line test signal. A row decoder control unit(200) enables or disables a word line off signal according to the row decoder control signal.
申请公布号 KR20080092683(A) 申请公布日期 2008.10.16
申请号 KR20070036333 申请日期 2007.04.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HWANG, JEONG TAE;KYUNG, KI MYUNG
分类号 G11C29/00;G11C8/08 主分类号 G11C29/00
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