发明名称 APPARATUS AND METHOD FOR VAPOR PHASE DEPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a novel apparatus and method for vapor phase deposition in which a film to be formed on a semiconductor wafer is made approximately uniform and variations in the impurity concentration is also reduced. SOLUTION: In a vapor phase deposition apparatus, a wafer 102 placed on a support table 101 is housed within a chamber 103, and a first channel 121 which supplies gas for forming a film on the wafer 102 and a second channel 131 which supplies gas for controlling the concentration of an impurity in the film formed on the wafer 102, are connected to the chamber. In the vapor phase deposition apparatus, the first channel is branched into two paths 1a and 1b, and the second channel is branched into two paths 2a and 2b so as to supply a gas individually to a peripheral portion and to a central portion on the wafer 102. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008251946(A) 申请公布日期 2008.10.16
申请号 JP20070093133 申请日期 2007.03.30
申请人 NUFLARE TECHNOLOGY INC 发明人 MORIYAMA YOSHIKAZU;ARAI HIDEKI;NAKAZAWA SEIICHI;SUZUKI KUNIHIKO;SUMIMATSU NORIKI;INADA SATOSHI
分类号 H01L21/205;C23C16/455;C30B25/14;C30B29/06 主分类号 H01L21/205
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