发明名称 |
Semiconductor Device and Manufacturing Method Thereof |
摘要 |
Electrode pads ( 5 ) and a solder resist ( 7 ) are disposed on the upper surface of a wiring board ( 1 ), and apertures ( 7 a) are formed in the solder resist ( 7 ) so as to expose the electrode pads ( 5 ). Electrodes ( 4 ) are disposed on the lower surface of a semiconductor element ( 2 ). Electrodes ( 4 ) are connected to the electrode pads ( 5 ) by way of bumps ( 3 ). An underfill resin ( 6 ) is disposed in the area that excludes the solder resist ( 7 ) and the bumps ( 3 ) in the space between the wiring board ( 1 ) and the semiconductor element ( 2 ). Between the wiring board ( 1 ) and the semiconductor element ( 2 ), the thickness (B) of the solder resist ( 7 ) is equal to or greater than the thickness (A) of the underfill resin ( 6 ) on the solder resist ( 7 ). The volume (Vb) of the bumps ( 3 ) is less than the volume (Vs) of the apertures ( 7 a).
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申请公布号 |
US2008251942(A1) |
申请公布日期 |
2008.10.16 |
申请号 |
US20050594844 |
申请日期 |
2005.01.12 |
申请人 |
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发明人 |
OHUCHI AKIRA;MURAKAMI TOMOO |
分类号 |
H01L23/498;H01L21/56;H01L21/60;H05K3/30;H05K3/34 |
主分类号 |
H01L23/498 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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