发明名称 CIRCUIT AND METHOD FOR ON DIE TERMINATION OF SEMICONDUCTOR MEMORY APPARATUS
摘要 A circuit and a method for on die termination of a semiconductor memory apparatus are provided to adjust a code value accurately regardless of an offset voltage and to prevent the code value from being changed into an abnormal value. A comparison unit outputs a comparison result signal by comparing a code voltage corresponding to a code with a reference voltage. A counting unit(130,230) changes the code according to the comparison result signal. A control unit(400,500) controls the operation of the counting unit according as a prior value of the comparison result signal coincides with the present value. The comparison unit comprises a first and a second comparator(120,220) operating at different timing.
申请公布号 KR20080092509(A) 申请公布日期 2008.10.16
申请号 KR20070035858 申请日期 2007.04.12
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, DONG UK
分类号 G11C7/10;G11C5/14 主分类号 G11C7/10
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