发明名称 SHORT CIRCUIT DETECTION CIRCUIT AND SHORT CIRCUIT/OPEN CIRCUIT DETECTION CIRCUIT, AND DETECTION METHODS THEREOF
摘要 PROBLEM TO BE SOLVED: To detect a short circuit, an open circuit, and so forth between a potential power feeding part and a power feeding path to an internal circuit such as an LSI. SOLUTION: The potential VR1 in which the potential of an external power supply 24 and the ground potential are divided by a resistance element 28 and a resistance element 30 is supplied to the internal circuit of the LSI via a power feeding path 34. The potential VR1 and the potential (VR1+α) of a first reference potential source 18 are compared by a first differential potential comparison circuit 12, and the potential VR1 and the potential (VR1-β) of a second reference potential source 20 are compared by a second differential potential comparison circuit 14. A determination circuit 16 determines whether either the external power supply 24 or the ground potential is short-circuited to the power feeding path 34 or not on the basis of the comparison outputs of the comparison circuits 12, 14. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008249642(A) 申请公布日期 2008.10.16
申请号 JP20070094297 申请日期 2007.03.30
申请人 NEC CORP 发明人 OGURI TAKASHI
分类号 G01R31/02;H03K17/00;H03K19/00 主分类号 G01R31/02
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