发明名称 Seal ring structures with reduced moisture-induced reliability degradation
摘要 A semiconductor chip includes a seal ring adjacent to edges of the semiconductor chip; an opening extending from a top surface to a bottom surface of the seal ring, wherein the opening has a first end on an outer side of the seal ring and a second end on an inner side of the seal ring; and a moisture barrier having a sidewall parallel to a nearest side of the seal ring, wherein the moisture barrier is adjacent the seal ring and has a portion facing the opening.
申请公布号 US2008251923(A1) 申请公布日期 2008.10.16
申请号 US20070786076 申请日期 2007.04.10
申请人 发明人 WANG CHIEN-JUNG;LIN JIAN-HONG
分类号 H01L23/522;H01L29/06 主分类号 H01L23/522
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