发明名称 SEMICONDUCTOR STRUCTURE INCLUDING TRENCH CAPACITOR AND TRENCH RESISTOR
摘要 <p>A structure and a method for fabrication of the structure use a capacitor trench for a trench capacitor and a resistor trench for a trench resistor. The structure is typically a semiconductor structure. In a first instance, the capacitor trench has a linewidth dimension narrower than the resistor trench. The trench linewidth difference provides an efficient method for fabricating the trench capacitor and the trench resistor. In a second instance, the trench resistor comprises a conductor material at a periphery of the resistor trench and a resistor material at a central portion of the resistor trench.</p>
申请公布号 EP1979949(A2) 申请公布日期 2008.10.15
申请号 EP20070710011 申请日期 2007.01.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHENG, KANGGUO;RASSEL, ROBERT, M.
分类号 H01L29/94;H01L21/02;H01L21/334;H01L27/01;H01L27/06;H01L29/66;H01L49/02 主分类号 H01L29/94
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