发明名称 TUNNELING TRANSISTOR WITH BARRIER
摘要 <p>The invention suggests a transistor (21) comprising a source (24) and a drain (29) as well as a barrier region (27) located between the source and the drain. The barrier region is separated from the source and the drain by intrinsic or lowly doped regions (26, 28) of a semiconductor material. Potential barriers are formed at the interfaces of the barrier region and the intrinsic or lowly doped regions. A gate electrode (32) is provided in the vicinity of the potential barriers such that the effective height and/or width of the potential barriers can be modulated by applying an appropriate voltage to the gate electrode.</p>
申请公布号 EP1979935(A1) 申请公布日期 2008.10.15
申请号 EP20070700678 申请日期 2007.01.24
申请人 NXP B.V. 发明人 HURKX, GODEFRIDUS;AGARWAL, PRABHAT
分类号 H01L21/336;H01L29/06;H01L29/10;H01L29/78 主分类号 H01L21/336
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