发明名称 Designing of a logic circuit for testability
摘要 The area of the circuit to be added for easy testability is reduced. Operations contained in a behavioral description are extracted in an operation analyzing unit; when expanding any operation at the time of behavioral synthesis, if the area of the circuit can be reduced to a greater extent when a DFT is applied to the operation before expansion, a parameter indicating that the operation is not to be expanded at the time of behavioral synthesis is generated and DFT information is added to a DFT library. A behavioral synthesis unit, in accordance with the parameter, generates an RTL description without expanding the operation. A DFT unit implements the DFT by referring to the DFT library, and thereafter expands the operation.
申请公布号 US7437340(B2) 申请公布日期 2008.10.14
申请号 US20020190158 申请日期 2002.07.05
申请人 SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTER 发明人 DATE HIROSHI;HOSOKAWA TOSHINORI;MURAOKA MICHIAKI
分类号 G01R31/28;G06F17/00;G01R31/317;G06F17/50;G06N5/02 主分类号 G01R31/28
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