Semiconductor memory device including fuse detection circuit to determine successful fuse-cutting rate for optical fuse-cutting conditions

摘要

A fuse detection method for reading out a program state of each fuse and generating a killer signal indicating the program state of the fuse; counting the program state indicated by the killer signal to obtain a count value; inputting an expected value for the program state of the fuse; and determining whether the count value coincides with the expected value by comparing the count value with the expected value.