| 摘要 |
A dual current perpendicular to plane (CPP) sensor having an in stack bias structure disposed between first and second free layers. The hard bias structure includes a plurality of magnetic layers antiparallel coupled with one another. At least one of the magnetic layers of the in stack bias structure includes a layer of Ni sandwiched between first and second layer of NiFe. The Ni provides a strong negative magnetostriction that sets the moment of the magnetic layer in a desired direction parallel with the ABS while the NiFe layers at either side of the Ni provide good antiparallel coupling properties, allowing the magnetic layer to be antiparallel coupled with adjacent magnetic layers of the in stack bias structure.
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