发明名称 Method of fabricating storage capacitor in semiconductor memory device, and storage capacitor structure
摘要 A storage capacitor has a double cylinder type structure, with a small cylinder in a lower part thereof and a cylindrical lower electrode structure disposed on the cylindrical contact plug. A method of fabricating the storage capacitor includes: forming a contact hole for exposing an activation region of a transistor; depositing a conductive film to form within the contact hole a contact plug of the storage capacitor having a void therein; opening an upper part of the void of the contact plug; and covering a surface of the device with material to form the storage capacitor electrode, to obtain the storage capacitor electrode having a double cylindrical structure.
申请公布号 US7436014(B2) 申请公布日期 2008.10.14
申请号 US20050134261 申请日期 2005.05.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SON WOOK-SUNG
分类号 H01L27/108;H01L29/72;H01L21/02;H01L21/768;H01L21/8242 主分类号 H01L27/108
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