| 摘要 |
Methods and systems for measuring and/or inspecting a characteristic of an optical article are provided. In one example, a method includes illuminating an optical article with a focused beam of light, detecting the light with a sensor after interacting with the optical article, determining a deflection angle of the beam of light, and determining a characteristic of the optical article based on the deflection angle. In one example, a system includes a light source, an optical element, and a sensor. The optical element focuses light from the light source to a reference location, the sensor detects the light from the reference location and generates signals associated with the intensity and position of the light received. A processor may receive the signals from the sensor and thereby determine a deflection angle of the light from the probe path.
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