| 摘要 |
Method for multi-parametric structural diagnostics of monocrystals with several types of defects that is in fact that monocrystal under investigation is radiated with beam of X-rays with chosen wavelengthand known intensity, one performs there Bragg-diffraction on system of planes (hkl), with measurement of dependence of diffracted intensityin whole angular range of curve of diffraction reflection where- angle of deflection of sample from diffraction maximum, with determination of coefficient of diffraction reflection, that consists of sum:, whereи- angular dependences of coherent and diffusive components of reflection ability of monocrystal, respectively, at that Bragg diffraction is performed in interval of angles,andis fromand, where- characteristics of dimensions and form of defects,- concentration of defects,- type of defects, for correction of obtained values of parameters of defects one performs Laue diffraction on system of planes (hkl). |
