发明名称 PHASE TRANSITION MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a phase transition memory device capable of minimizing thermal interference phenomenon between mutually adjacent phase transition patterns. SOLUTION: A first electrode 71 having a first surface S1 is disposed on a substrate 51. A second electrode 72 having a second surface S2 positioned at a level different from that of the first surface S1 is provided. The electrode 72 is isolated from the electrode 71. A third electrode 81 corresponding to the electrode 71 is disposed. A fourth electrode 82 corresponding to the electrode 72 is disposed. A first phase transition pattern 77 is interposed between the first surface S1 and the electrode 81. A second transition pattern 78 is interposed between the second surface S2 and the electrode 82. Upper surfaces of the pattern 77 and the pattern 78 are disposed on the same plane. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008244439(A) 申请公布日期 2008.10.09
申请号 JP20080022848 申请日期 2008.02.01
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 AN HYEONG-GEUN;HORII HIDEKI;SHIN JONG-CHAN;AN TOKO;BAE JUN-SOO;PARK JEONG-HEE
分类号 H01L27/105;H01L45/00 主分类号 H01L27/105
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