FAULT LOCATING DEVICE, FAULT LOCATING METHOD, AND INTEGRATED CIRCUIT

摘要

A fault locating device (20) for locating a fault in an integrated circuit which comprises a scan chain (12) formed by connecting sequential circuits (13) and outputting an output data string by shifting out setting data set in each of the sequential circuits (13). The fault locating device comprises a setting unit (22) for setting a value previously specified in at least one sequential circuit (18) out of the sequential circuits (13) as the setting data and a locating unit (24) for locating a fault in the scan chain (12) based on the output data string from the scan chain (12) and the position of the at least one sequential circuit (18) in the scan chain (12), thereby locating the fault in the scan chain easily and in a short time in a scan test.