发明名称 |
INCLINED-SLIT SPECTROGRAPH |
摘要 |
<p>The invention relates to an inclined-slit spectrograph comprising a light source (1), an inlet slit (3), a grating (4) and a detector (7) including a window through which the light beam diffracted by the grating (4) is transmitted, in which part of the diffracted light beam generates reflections on the window or between the window and the sensitive surface of the detector (7). According to the invention, the inclined slit spectrograph includes a compensation means that can compensate for spectral resolution losses generated by the inclination means, said compensation means including the inlet slit (3, 9) which takes the form of a rectangular inclined inlet slit (9).</p> |
申请公布号 |
WO2008119906(A1) |
申请公布日期 |
2008.10.09 |
申请号 |
WO2008FR50334 |
申请日期 |
2008.02.27 |
申请人 |
HORIBA JOBIN YVON SAS;THEVENON, ALAIN;MILLET, VIVIANE;CORDE, PIERRE-ANDRE |
发明人 |
THEVENON, ALAIN;MILLET, VIVIANE;CORDE, PIERRE-ANDRE |
分类号 |
G01J3/02;G01J3/04;G01J3/28 |
主分类号 |
G01J3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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