发明名称 A SOURCE OF LIGHT WITH THE TEST OF ELECTRONIC PARTS
摘要 A light source for a test of an electronic part is provided to facilitate adjustment of a distance between the light source and a subject by simplifying a structure. A light source for a test of an electronic part includes a plurality of lamps and a reflection sheet(350). The lamps are arranged on a circumference at equal intervals. The reflection sheet is positioned in front of the lamps to form indirect light at an inner diameter side by reflecting light irradiated from the lamps to an entire surface. The lamps are arranged at an inner diameter side of a ring-shaped substrate at the equal intervals to have a radial shape. The lamps are inclined with respect to the reflection sheet in a horizontal direction.
申请公布号 KR20080090643(A) 申请公布日期 2008.10.09
申请号 KR20070033717 申请日期 2007.04.05
申请人 SHIN, YONG KWAN 发明人 SHIN, YONG KWAN
分类号 F21V7/00;H05K13/08 主分类号 F21V7/00
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