发明名称 CIRCUIT BOARD INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To very easily specify a probe pin to be an exchange object in a circuit board inspection device provided with a plurality of probe pins brought into contact, using a contact pin on a circuit board mounting electronic components. SOLUTION: A control program for controlling the circuit board inspection device 2 stores the identification number of a circuit board 20 and the number of the probe pin 19 used for inspection of an inspection item having inferiority to a storing means 3c of a computer device 3, when the inferiority is determined as a result of the inspection of the circuit board 20. When the circuit board is a superior product as the result having inspected the circuit board 20 again, a message promoting exchanging of the probe pin 19 and the number of the probe pin which is an exchange object are displayed on a display device 5, since contact inferiority due to the deterioration of the probe pin 19 is determined. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008241568(A) 申请公布日期 2008.10.09
申请号 JP20070084645 申请日期 2007.03.28
申请人 SEIKO EPSON CORP 发明人 OTOMARU SOICHI
分类号 G01R31/28;G01R31/02;H05K3/00 主分类号 G01R31/28
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