发明名称 |
SEMICONDUCTOR DEVICE, AND ITS MANUFACTURING METHOD |
摘要 |
<p>Provided are a semiconductor device capable of improving its yields better than the prior art, and a method for manufacturing the semiconductor device. The semiconductor device comprises a silicon substrate (1), an element-separating insulating film (2) formed on the silicon substrate (1), a tunnel insulating film (5) formed in the element-separating insulating film (2) over the silicon substrate (1), band-shaped patterns (6e) formed individually over the element-separating insulating film (2) and the tunnel-insulating film (5) and composed alternately of a floating gate portion (6c) and a cell separating portion (6d), an intermediate insulating film (7) formed over the band-shaped pattern (6e), and a band-shaped control gate (8a) formed over the intermediate insulating film (7) and extending in the same direction as that of the band-shaped pattern (6e).</p> |
申请公布号 |
WO2008120384(A1) |
申请公布日期 |
2008.10.09 |
申请号 |
WO2007JP56960 |
申请日期 |
2007.03.29 |
申请人 |
FUJITSU MICROELECTRONICS LIMITED;MATSUKAWA, YOSHIHIRO;TAKAHASHI, MAKOTO |
发明人 |
MATSUKAWA, YOSHIHIRO;TAKAHASHI, MAKOTO |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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