发明名称 METHOD OF PROCESSING WORKPIECE AND WIRING FORMATION METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method of processing a workpiece capable of easily processing the workpiece in a desired shape without giving mechanical damage and thermal damage. SOLUTION: A sample 1 made of at least one type of material selected from a group comprising a semiconductor including silicon, silicon carbide, and group III-V elements is used as a workpiece. The sample 1 is immersed into a processing liquid 8 comprising a solution containing hydrofluoric acid or a fluoride ion. In the processing liquid 8, the workpiece is brought into contact with a wire 2 having a layer made of a catalyst in the oxidation reaction of the material at least on the surface and an electrochemical reaction is generated at the contact section with the sample 1 with the wire 2 as a positive electrode, thus oxidizing the contact section with the wire 2 in the material 1 for dissolving into the processing liquid 8, moving the wire 2 with gravity following the dissolution of the sample 1, and cutting the sample 1 or forming a cut in the sample 1. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008243850(A) 申请公布日期 2008.10.09
申请号 JP20070077760 申请日期 2007.03.23
申请人 SHARP CORP;OSAKA UNIV 发明人 IMAI SHIGENORI;MATSUMURA MICHIO;TSUJINO KAZUYA;RI KARYU
分类号 H01L21/3063;C25F3/00;H01L21/316;H01L21/3205;H01L23/52 主分类号 H01L21/3063
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