发明名称 METHOD AND APPARATUS FOR IMPROVED CHEMICAL MECHANICAL PLANARIZATION AND CMP PAD
摘要 A polishing pad includes a guide plate, a porous slurry distribution layer and a flexible under-layer. Polishing elements are interdigitated with one another through the slurry distribution layer and the guide plate. The polishing elements may be affixed to the compressible under-layer and pass through corresponding holes in the guide plate so as to be maintained in a substantially vertical orientation with respect to the compressible under-layer but be translatable in a vertical direction with respect to the guide plate. Optionally, a membrane may be positioned between the guide plate and the slurry distribution layer. The polishing pad may also include wear sensors to assist in determinations of pad wear and end-of-life.
申请公布号 US2008248734(A1) 申请公布日期 2008.10.09
申请号 US20070697622 申请日期 2007.04.06
申请人 BAJAJ RAJEEV 发明人 BAJAJ RAJEEV
分类号 B24B7/00;B24B29/00 主分类号 B24B7/00
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