发明名称 METHOD OF MEASURING SKIN CONDUCTANCE, METHOD OF ANALYZING COMPONENT CONCENTRATION, SKIN CONDUCTANCE MEASURING APPARATUS, AND COMPONENT CONCENTRATION ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of measuring skin conductance for estimating conductance of a prescribed component to a skin with a higher degree of accuracy. <P>SOLUTION: The method of measuring skin conductance comprises the step of supplying purified water as a medium for retaining a tissue fluid containing a prescribed component of a subject to a mesh sheet 201, of disposing the mesh sheet 201 in an extraction region 501 of the skin 500 of the subject, of extracting the tissue fluid in the purified water within the mesh sheet 201 through the extraction region 501, of supplying electric power between a working electrode 203 for supplying electric power to the extraction region 501 and a dry electrode 1 for supplying electric power to a region 502 other than the extraction region 501, and of measuring the conductance of the extraction region 501 from the electric power supplied between the working electrode 203 and the dry electrode 1. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008237271(A) 申请公布日期 2008.10.09
申请号 JP20070078375 申请日期 2007.03.26
申请人 SYSMEX CORP 发明人 OKADA MASANORI;MAEKAWA YASUNORI;ASANO KAORU
分类号 A61B5/1468;A61B5/05 主分类号 A61B5/1468
代理机构 代理人
主权项
地址