Method of testing a semiconductor integrated circuit

摘要

A method of testing a semiconductor integrated circuit is disclosed. Specifically, a method of testing a semiconductor integrated circuit comprising a plurality of flip-flops is provided. The disclosed method includes connecting the plurality of flip-flops in series so that the plurality of flip-flops forms a scan-chain; inputting data to the scan-chain while supplying a clock signal to the plurality of flip-flops so that the data is set in the plurality of flip-flops; retaining the data in the plurality of flip-flops while inhibiting the clock signal for a predetermined period; restarting the clock signal to the plurality of flip-flops so that the data retained in the plurality of flip-flops is output from the scan-chain; and comparing the data output from the scan-chain and the data input to the scan-chain to test data retention of the plurality of flip-flops.