发明名称 PLATEN FOR CMP APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To facilitate maintenance work for a platen and realize both of peeling capability and corrosion resistance. <P>SOLUTION: In the CMP apparatus 10 which supplies slurry to a grinding pad 13 stuck on the rotated and driven platen 11 (11a) and presses a wafer to the grinding pad 13 to be ground, the platen 11 includes an aluminum alloy body part 17, a nickel layer 18 shielded on a surface of the body part 17, and a peeling adjusting layer 19 formed on the nickel layer 18. The peeling adjusting layer 19 has appropriate peeling capability to the grinding pad 13. Besides, the peeling adjusting layer 19 is formed by fluorine-resin for example, and has both of the peeling capability for the grinding pad 13 and the corrosion resistance to chemicals L such as slurry. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008238375(A) 申请公布日期 2008.10.09
申请号 JP20070085758 申请日期 2007.03.28
申请人 TOKYO SEIMITSU CO LTD 发明人 WATABE KYOJI;FUJITA TAKASHI
分类号 B24B37/12;B24B37/14;H01L21/304 主分类号 B24B37/12
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