发明名称 APPARATUS AND METHOD TO MANAGE EXTERNAL VOLTAGE FOR SEMICONDUCTOR MEMORY TESTING WITH SERIAL INTERFACE
摘要 A serial-interface flash memory device includes a data/address I/O pin and a clock input pin. A bidirectional buffer is coupled to the data/address I/O pin. A serial interface logic block including data direction control is coupled to the clock pin, the bidirectional buffer, to internal control logic, and to read-voltage and modify-voltage generators. A first switch is coupled to the read-voltage generator and the clock buffer and a second switch is coupled to the modify-voltage generator and the clock buffer, the first and second switches each having a control input. Memory drivers are coupled to the read-voltage generator and the modify-voltage generator through the first and second switches. First and second registers coupled between the serial interface logic and the first and second switches. A memory array is coupled to the memory drivers and read amplifiers and program buffers are coupled between the serial interface logic and the memory drivers.
申请公布号 US2008246504(A1) 申请公布日期 2008.10.09
申请号 US20070696521 申请日期 2007.04.04
申请人 ATMEL CORPORATION 发明人 SURICO STEFANO;PASSERINI MARCO;FRULIO MASSIMILIANO;POJER ALEX
分类号 G01R31/00 主分类号 G01R31/00
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