发明名称 STRUCTURAL SURFACE MEASURING AND ALIGNING APPARATUS AND METHOD
摘要 An apparatus (10) and method provide for measurement at various positions over an extent of an uneven structural surface (12), and preparation of spacers (14), cut to appropriate thicknesses based upon such measurements, such that when affixed to the respective measurement locations, outer facing surfaces of the spacers (14) are collectively coplanar A method of aligning a surface (12) includes defining a reference plane in a fixed condition relative to the structural surface (12), and determining a differential distance between the structural surface (12) and the reference plane at various locations along an extend of the particular structural surface (12). Using these measurements, indexed according to location, spacers (14) are cut to a thickness based upon the respective differential distances at corresponding locations, which, when mounted to the structural surface (12) at these recorded locations, results in alignment of outwardly facing surfaces with a common plane. Advantageously, at least a portion of the processes is automated.
申请公布号 WO2008019027(A3) 申请公布日期 2008.10.09
申请号 WO2007US17208 申请日期 2007.08.02
申请人 MCCAULEY, KERRY 发明人 MCCAULEY, KERRY
分类号 E04F21/00;E04B2/82;E04B9/00;E04G1/22 主分类号 E04F21/00
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