发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a semiconductor device is provided to prevent resistance increase in a gate electrode and to easily perform a gate patterning process by reducing the resistivity as suppressing the increase of roughness. A method for manufacturing a semiconductor device comprises the following steps of: forming a gate insulation layer(102), a conductive layer(104) and a metal layer(106) on a semiconductor substrate(100); performing an ion implantation process to form an ion implantation region in the boundary between the conductive layer and the metal layer; performing a flash heat-treatment for the ion-implanted semiconductor substrate; and patterning the metal layer, the conductive layer and the gate insulation layer. The ion implantation process is performed by using one of phosphor(P), arsenic(As), germanium(Ge) or silicon(Si) ion.
申请公布号 KR20080090862(A) 申请公布日期 2008.10.09
申请号 KR20070034244 申请日期 2007.04.06
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, DONG HO;HONG, KWON;KIM, JAE MUN;KIM, HEE SOO;KOO, JAE HYOUNG
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址