发明名称 |
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE |
摘要 |
A method for manufacturing a semiconductor device is provided to prevent resistance increase in a gate electrode and to easily perform a gate patterning process by reducing the resistivity as suppressing the increase of roughness. A method for manufacturing a semiconductor device comprises the following steps of: forming a gate insulation layer(102), a conductive layer(104) and a metal layer(106) on a semiconductor substrate(100); performing an ion implantation process to form an ion implantation region in the boundary between the conductive layer and the metal layer; performing a flash heat-treatment for the ion-implanted semiconductor substrate; and patterning the metal layer, the conductive layer and the gate insulation layer. The ion implantation process is performed by using one of phosphor(P), arsenic(As), germanium(Ge) or silicon(Si) ion. |
申请公布号 |
KR20080090862(A) |
申请公布日期 |
2008.10.09 |
申请号 |
KR20070034244 |
申请日期 |
2007.04.06 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, DONG HO;HONG, KWON;KIM, JAE MUN;KIM, HEE SOO;KOO, JAE HYOUNG |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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