发明名称 SEMICONDUCTOR DEVICE PACKAGE WITH DIE RECEIVING THROUGH-HOLE AND THROUGH-HOLE CONNECTING STRUCTURE AND METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device package with a die receiving through-hole and a through-hole connecting structure. <P>SOLUTION: The semiconductor device package 100 comprises a substrate 102 having the die receiving through-hole 105, the through-hole connecting structure 114, a first conductive pad 113 on an upper surface of the substrate, and a second conductive pad 115 on a lower surface of the substrate. A die is disposed within the die receiving through-hole. A first adhesion material 106 is formed under the die and a second adhesion material 107 is filled in the gap between the die and the sidewall of the die receiving through-hole of the substrate. Further, a bonding wire 112 is formed to couple a bonding pad 108 and the first conductive pad. A dielectric layer 118 is formed on the bonding wire, the die, and the substrate. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008244451(A) 申请公布日期 2008.10.09
申请号 JP20080037933 申请日期 2008.02.19
申请人 ADVANCED CHIP ENGINEERING TECHNOLOGY INC 发明人 YANG WEN-KUN;LIN DIANN-FANG;WANG TUNG-CHUAN;HSU HSIEN-WEN
分类号 H01L23/12;H01L21/52 主分类号 H01L23/12
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