SYSTEMS AND METHODS TO ANALYZE MULTIPLEXED BEAD-BASED ASSAYS USING BACKSCATTERED LIGHT

摘要

This invention relates to a system and method related to an epifluorescence microscope based optical system equipped with a tunable filter to localize microspheres in bead-based assays based on a back-scattered light (also known as reflected light) image. A common optical path for reflected and emitted luminescence in conjunction with a tunable filter negates the requirement of an additional sensor employed in existing technologies for localizing microspheres based on light scatter measurements.