发明名称 CMP PAD CONDITIONER
摘要 <P>PROBLEM TO BE SOLVED: To provide a CMP pad conditioner capable of uniformly conditioning whole surface of the pad even in a polishing pad for the CMP having evenness on the surface, and capable of stably conditioning without generating chattering during conditioning even under high-load condition. <P>SOLUTION: A pad conditioner has a superabrasive grain layer formed by fixing a single layer of the superabrasive grains on the surface of a disc-shape metal base. The superabrasive grain layer is formed on the whole surface of a concentric annular shape area and a concentric circular shape area on the disc shape metal base. In the annular shape area, the intermediate neighborhood of the width in the radial direction is protruded, and the circular shape area is a protruded shape which is the highest on the central axis of the disc-shape metal base. As for the difference in height between tops, the top of the protruded part of the circular shape area is preferably made to be higher than the top of the protruded part of the annular shape area by 5 to 100 &mu;m. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008238310(A) 申请公布日期 2008.10.09
申请号 JP20070080636 申请日期 2007.03.27
申请人 ALLIED MATERIAL CORP 发明人 YAMAZAKI SHIGEKAZU
分类号 B24B53/12;B24D3/00;B24D3/06;B24D7/00;H01L21/304 主分类号 B24B53/12
代理机构 代理人
主权项
地址