发明名称 THICKNESS CONTROLLING METHOD FOR SHEETLIKE MATTER, AND SHEETLIKE MATTER OBTAINED USING THE METHOD
摘要 PROBLEM TO BE SOLVED: To provide a thickness controlling method for sheetlike matter, capable of quickly realizing a desired TD thickness profile by controlling the thickness of the sheetlike matter based on TD thickness data obtained by removing in order the noise components in the MID thickness variation from the scanning date in the width direction of the total thickness. SOLUTION: The thickness controlling method for the sheetlike matter includes: detecting a peak frequency resulting from the MD thickness variation by subjecting the TD thickness data of the sheetlike matter measured with an online thickness meter to Fourier transform; removing the data in the peak frequency range having an intense exceeding a preset threshold value; processing the data having a partial frequency range removed to the TD thickness data by subjecting the data having the partial frequency range removed to the Fourier transform; and using the processed data for the calculation of the thickness control. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008238675(A) 申请公布日期 2008.10.09
申请号 JP20070084357 申请日期 2007.03.28
申请人 KANEKA CORP 发明人 TANAKA SHIGERU
分类号 B29C41/52;B29C41/24;B29L7/00 主分类号 B29C41/52
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