发明名称 SURFACE SHAPE MEASUREMENT APPARATUS AND SURFACE SHAPE MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a surface shape measurement apparatus and a surface shape measurement method for accurately measuring a surface shape. SOLUTION: The surface shape measurement apparatus of the invention comprises a sensor head 12 provided with a light source 21, and an optical sensor 25 for receiving a reflection light reflected by a sample 11; an X-drive mechanism 17 for changing a relative position between the sensor head 12 and the sample 11; a position extracting section 31 for extracting the incident position of the reflection light on the optical sensor 25; a transform section 32 for transforming position data for mapping the relative position to the incident position of the reflection light into frequency domain data; a filter section 33 for filtering a component of the frequency domain data at a fixed frequency or higher, or in a predetermined frequency band; and an inverse transform section 34 for inverse-transforming the filtered frequency domain data into spatial domain data. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008241506(A) 申请公布日期 2008.10.09
申请号 JP20070083531 申请日期 2007.03.28
申请人 LASERTEC CORP 发明人 MIYAI HIROMOTO;KUSUSE HARUHIKO;AWAMURA NAOKI;KOIKE HIDEYUKI
分类号 G01B11/24 主分类号 G01B11/24
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