SYSTEM FOR VISION INSPECTION OF SEMICONDUCTOR DEVICE
摘要
<p>The present invention to provide a system for vision insfection of semiconductor device that is capable of receiving a tray to be visually inspected and an unloading tray to receive semiconductor device sorted as good products as a result of the vision inspection to the same loader, and distributing the good semiconductor device to a tray stacked in the same loader or a tray stacked in the opposite loader according to the results of the vision inspection, thereby eliminating a necessity to individually provide loaders and unloaders, and therefore, reducing the size of equipment.</p>
