| 摘要 |
A testing apparatus includes a circuit board and a first probe. The circuit board has a first testing point and a second testing point. The first testing point is electrically connected to an integrated circuit, and the second testing point is electrically connected to the first testing point. The first probe is used for electrically contacting with the first testing point and transmitting a signal to the integrated circuit through the first testing point. The second testing point is used for detecting if the first probe electrically contacts with the first measuring point. A testing method is also disclosed herein.
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