发明名称 |
METHOD FOR EVALUATING SOLDER JOINT PORTION |
摘要 |
A method for evaluating a solder joint portion by means of which a part and a substrate are joined to each other includes a preparation process for preparing the substrate including the solder joint portion, a thermal shock process for applying thermal shock to the solder joint portion multiple times, and an evaluation process for obtaining a change of a crystal grain size in the solder joint portion caused by the application of the thermal shock so as to evaluate a lifespan of the solder joint portion based on the change of the crystal grain size obtained.
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申请公布号 |
US2008240201(A1) |
申请公布日期 |
2008.10.02 |
申请号 |
US20080056745 |
申请日期 |
2008.03.27 |
申请人 |
AISIN SEIKI KABUSHIKI KAISHA |
发明人 |
KOIKE HIROFUMI;MATSUMOTO AKIKAZU;YAGI WATARU;ISOGAI TAKEFUMI;HIROSE YOSHIHARU;KADOURA HIROAKI;SEKI JUNTARO;TAKAO HISAAKI |
分类号 |
G01N25/72 |
主分类号 |
G01N25/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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