发明名称 METHOD FOR EVALUATING SOLDER JOINT PORTION
摘要 A method for evaluating a solder joint portion by means of which a part and a substrate are joined to each other includes a preparation process for preparing the substrate including the solder joint portion, a thermal shock process for applying thermal shock to the solder joint portion multiple times, and an evaluation process for obtaining a change of a crystal grain size in the solder joint portion caused by the application of the thermal shock so as to evaluate a lifespan of the solder joint portion based on the change of the crystal grain size obtained.
申请公布号 US2008240201(A1) 申请公布日期 2008.10.02
申请号 US20080056745 申请日期 2008.03.27
申请人 AISIN SEIKI KABUSHIKI KAISHA 发明人 KOIKE HIROFUMI;MATSUMOTO AKIKAZU;YAGI WATARU;ISOGAI TAKEFUMI;HIROSE YOSHIHARU;KADOURA HIROAKI;SEKI JUNTARO;TAKAO HISAAKI
分类号 G01N25/72 主分类号 G01N25/72
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