摘要 |
An isolation structure for a semiconductor device comprises a floor isolation region, a dielectric filled trench above the floor isolation region and a sidewall isolation region extending downward from the bottom of the trench to the floor isolation region. This structure provides a relatively deep isolated pocket in a semiconductor substrate while limiting the depth of the trench that must be etched in the substrate. A variety of devices, including MOSFETs, bipolar transistors, diodes, and JFETs, are formed in the isolated pocket. |
申请人 |
ADVANCED ANALOGIC TECHNOLOGIES, INC.;WILLIAMS, RICHARD, K.;DISNEY, DONALD, RAY;CHAN, WAI, TIEN |
发明人 |
WILLIAMS, RICHARD, K.;DISNEY, DONALD, RAY;CHAN, WAI, TIEN |