发明名称 ISOLATED INTEGRATED CIRCUIT DEVICES
摘要 An isolation structure for a semiconductor device comprises a floor isolation region, a dielectric filled trench above the floor isolation region and a sidewall isolation region extending downward from the bottom of the trench to the floor isolation region. This structure provides a relatively deep isolated pocket in a semiconductor substrate while limiting the depth of the trench that must be etched in the substrate. A variety of devices, including MOSFETs, bipolar transistors, diodes, and JFETs, are formed in the isolated pocket.
申请公布号 WO2008118271(A1) 申请公布日期 2008.10.02
申请号 WO2008US02558 申请日期 2008.02.27
申请人 ADVANCED ANALOGIC TECHNOLOGIES, INC.;WILLIAMS, RICHARD, K.;DISNEY, DONALD, RAY;CHAN, WAI, TIEN 发明人 WILLIAMS, RICHARD, K.;DISNEY, DONALD, RAY;CHAN, WAI, TIEN
分类号 H01L21/76 主分类号 H01L21/76
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