| 摘要 |
PROBLEM TO BE SOLVED: To solve the problems wherein, since a semiconductor testing device based on a conventional technology is constituted on the premise that only a single test item is performed, the capacity value of a capacitor mounted on the testing device or the like cannot be changed easily, and a switching relay has only the ON or OFF state, and, for example, as for the capacitor, only two kinds of 0μF and the capacity mounted on the testing device can be selected. SOLUTION: This semiconductor testing device is equipped with a power source circuit part having power source wiring for supplying a plurality of supply voltages to a device to be measured, a plurality of noise removal parts connected to each of the power source wiring relative to the device to be measured, and a switching part for selecting an optional noise removal part connected electrically to the device to be measured from the plurality of noise removal parts. COPYRIGHT: (C)2009,JPO&INPIT
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