发明名称 Method for fabricating semiconductor device
摘要 A method for fabricating a semiconductor device is disclosed. The method includes providing a first chamber and a second chamber. The first chamber and the second chamber are connected by a pressure differential unit, for depositing a metallic film over a substrate in the first chamber, transferring the substrate to the second chamber via the pressure differential unit without exposing the substrate to the ambient environment, and depositing a silicon-containing film on the metallic film in the second chamber.
申请公布号 US2008242108(A1) 申请公布日期 2008.10.02
申请号 US20070730551 申请日期 2007.04.02
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHANG WENG;YEN FONG-YU;TAO HUN-JAN;LIANG MONG-SONG
分类号 H01L21/46 主分类号 H01L21/46
代理机构 代理人
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